11th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC'17)

Topics: Nanotechnology, Materials Science, Analytical Chemistry, Physical Chemistry, Keywords: see below

Date: /3/4/5/6/7/8/ December 2017, Kauai (Hawaii), USA, North America

More Information, Contact: alc17 [at] jsps141.surf.nuqe.nagoya-u.ac.jp


Official Information:

The ALC symposia focus on practical applications of atomic level characterization (both atomic dimensions and energy levels) of new materials and devices, including bio- and organic materials as well as inorganics. The event covers new applications and instrumentation for various analytical techniques of surface and interface analysis. The symposium also encourages discussion of fundamental problems to be solved in the further development of atomic level characterization of materials, including approaches based on theory and simulations.


  • Fundamental Phenomena
    • electron/ion/photon -solid interactions
    • emission phenomena of light, electrons, and ions
  • Characterization by Electrons / Ions / Infrared / Ultraviolet / X-rays
    • AES / XPS / XPED / EPMA / ISS / MEIS / RBS / SIMS / IR / etc.
  • Imaging Techniques
    • TEM / STEM / AEM / SEM / SAM / REM / LEEM / PEEM
    • SPM / FIM / TOF-SIMS / optical molecular imaging / ultrafast imaging / etc.
  • Applications for Nanotechnology
    • nanowires / nanotubes / nanoparticles / graphene and 2D materials
    • solid-solid / solid-liquid interfaces
  • Advanced Materials Characterization
    • spintronics materials
    • environmental and advanced energy materials
    • biological and medical systems
    • cosmic and terrestrial materials
  • Special Sessions
    • Surface modifications of 2D materials
    • Operando spectroscopy and ambient pressure measurements
    • 3D holographic imaging and characterizations of active atomic sites
  • Tutorials