12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19)
Date: /20/21/22/23/24/25/ October 2019, Kyoto, Japan, Asia
More Information, Contact: alc19 [at] alc.jsps141.org
The ALC symposia focus on practical applications of atomic level characterization (both atomic dimensions and energy levels) of new materials and devices, including bio- and organic materials as well as inorganics. Descriptions of new applications and instrumentation for various analytical techniques of surface and interface analysis are solicited in these symposia..
electron/ion/photon -solid interactions
emission phenomena of light, electrons, and ions
Characterization by Electrons / Ions / Infrared / Ultraviolet / X-rays
AES / XPS / XPED / EPMA / ISS / MEIS / RBS / SIMS / IR / etc.
TEM / STEM / AEM / SEM / SAM / REM / LEEM / PEEM
SPM / FIM / TOF-SIMS / optical molecular imaging / ultrafast imaging / etc.
Applications for Nanotechnology
nanowires / nanotubes / nanoparticles / graphene and 2D materials
solid-solid / solid-liquid interfaces
Advanced Materials Characterization
environmental and advanced energy materials
cosmic and terrestrial materials
Characterization of water on materials surface
Materials informatics and machine learning
Operando spectroscopy and ambient pressure measurements
Advanced biological and medical characterization (jointly-organized with SIMS XXII)